Paul Johnson
Posts by Paul Johnson for Blogs
Fast, High Throughput Formaldehyde Analysis Method for Fragrances
Read about high throughput SIFT-MS analysis of formaldehyde in fragrances that utilizes a method of standard additions to overcome matrix effects from variable headspace compositions of the samples tested. SIFT-MS delivers >2X faster time to data with up to 5X greater throughput than chromatographic methods.
Read MoreOn-Demand Webinar: Revolutionizing Workflows for Residual Solvents and Volatile Impurities Analyses by SIFT-MS
This webinar demonstrates how the new, automated Syft TracerTM SIFT-MS platform provides a comprehensive solution to workflow challenges and can replace multiple chromatographic systems. Learn how the next generation of real-time, trace gas analysis can revolutionize productivity for volatiles analyses. Watch on-demand now!
Read MoreOn-Demand LCGC Webinar for Advancing Volatile Impurities Workflows
This webinar demonstrates how the new, automated Syft TracerTM SIFT-MS platform provides a comprehensive solution to workflow challenges and can replace multiple chromatographic systems. Learn how the next generation of real-time, trace gas analysis can revolutionize productivity for volatiles analyses. Watch on-demand now!
Read MoreReplace Multiple Chromatography Systems with One Syft Tracer
Syft TracerTM replaces multiple chromatography systems while speeding up time to data. Diverse sample analyses can be run back to back without the need for column changeover or other time consuming steps associated with chromatographic methods.
Read MoreApp Note: Faster, Higher Throughput Quantitative Analysis of Formaldehyde
This application note describes how the efficiency of a MHE workflow can be significantly improved for MHE-SIFT-MS due to the stability of the technique. Formaldehyde impurity is analyzed easily and quantitatively in Gelucire excipient with this improved approach. The time-to-result is reduced to 85 minutes for this system – six-fold faster than the conventional MHE-SIFT-MS approach. Quantitative analysis is achieved at the throughput of 220 samples/day.
Read MorePittcon 2023 Recognizes Syft Innovation with Pittcon Today Excellence Award
Syft Technologies announced the release of its next generation Selected Ion Flow Tube Mass Spectrometry (SIFT-MS) technology, Syft Tracer™, at Pittcon 2023. This innovation of SIFT-MS was recognized at the conference with a Pittcon Today Excellence Award.
Read MoreApp Note: Introducing Syft Tracer - The Next Generation SIFT-MS
This app note introduces the next generation of SIFT-MS, Syft TracerTM, which launched at Pittcon and is debuting worldwide in 2023. It revolutionizes volatile impurities analysis workflows through unparalleled speed, performance stability, and reproducibility. Learn about how this innovation to real-time trace gas detection outpaces chromatography-based methods in the analysis of challenging analytes such as formaldehyde in a PEG excipient.
Read MoreSyft Tracer Launching at Pittcon and Debuting Worldwide in 2023
Syft Technologies launching the next generation of SIFT-MS, Syft Tracer, at Pittcon 2023! Schedule your live demo, attend the Syft Technologies poster session, and hear Leslie Silva’s talk entitled, “Real-time VOC Analysis of Contaminants & Impurities in Personal Care and Pharmaceutical Products.”
Read MoreSyft Tracer Launching at Pittcon and Debuting Worldwide in 2023
Syft Technologies launching the next generation of SIFT-MS, Syft Tracer, at Pittcon 2023! Schedule your live demo, attend the Syft Technologies poster session, and hear Leslie Silva’s talk entitled, “Real-time VOC Analysis of Contaminants & Impurities in Personal Care and Pharmaceutical Products.”
Read MoreApp Note: Head to Head Comparison of Class 2A And 2B Residual Solvents Analysis Using SIFT-MS And GC
This application note describes head-to-head comparison of GC-FID and SIFT-MS analyses of Class 2A and 2B residual solvents. The techniques perform similarly for linearity and repeatability, but SIFT-MS provides superior performance for accuracy and recovery along with significant advantages in speed and throughput.
Read MoreApp Note: Introducing Syft Tracer - Next Gen Volatile Impurities Analysis for Enhanced Workflows
This app note introduces the next generation of SIFT-MS, Syft TracerTM, which is launching at Pittcon 2023. It revolutionizes volatile impurities analysis workflows through unparalleled speed, performance stability, and reproducibility.
Read MoreOn-Demand Webinar: Hear About the Next Gen SIFT-MS Launched at Pittcon 2023
SIFT-MS is a direct-injection mass spectrometry technique that provides real-time, selective, and economic analysis of volatile compounds in the gas phase. Syft TracerTM is the next generation of real-time, direct injection mass spectrometry (MS) which is launching at Pittcon 2023. It provides the newest, most sensitive, and most robust platform of SIFT-MS technology.
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