How fast is Syft analysis?

SIFT-MS provides real-time trace gas detection of a broad range of compounds all at the same time. Watch this 2-minute demonstration of real-time data collection with a method targeting benzene, ethylene oxide, formaldehyde, hydrogen sulfide and toluene.

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Industries

Semiconductor

Online AMC monitoring solutions for semiconductor fabrication environmental control. Detect volatile organic compounds (VOCs) and inorganic airborne molecular contaminants (AMCs) in real-time and maximize your production yield.

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Environmental

The sensitive, selective and real-time analysis of SIFT-MS provides simple and continuous monitoring of trace VOCs in ambient air.

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Pharmaceutical

Real-time VOC analysis for pharma and CDMO applications. SIFT-MS delivers high-throughput solutions that increase your capacity and operational efficiency in residual solvent analysis, nitrosamine characterization, ethylene oxide and impurity detection, and detergent and sterilization monitoring.

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Petrochemical

Real-time VOC analysis for petrochemical applications that speeds up time to data in oil & gas surveying and production. Increase your capacity and shorten lead times in hydrocarbon characterization, BTEX fenceline monitoring, sour gas detection, and mudlogging.

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Other Industries

Syft Technologies supports a number of industries by helping them solve their most difficult analytical challenges. Read more about how SIFT-MS eliminates workflow bottlenecks by speeding up time to data. Discover the power of direct injection mass spectrometry that Increases capacity and operational efficiency in a variety of applications.

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What is SIFT-MS?

Selected ion flow tube mass spectrometry (SIFT-MS) is a form of direct mass spectrometry that analyzes volatile organic compounds (VOCs) and inorganic compounds in air, with typical detection limits at parts-per-trillion levels (by volume: pptV).

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Instant detection of process contaminants and environmental pollutants

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Enhanced selectivity for a wide range of VOCs and inorganics

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High detection sensitivity at the ppt level

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