Limits of detection (LODs) are of increasing importance to our customers as they strive to increase productivity, ensure compliance with more stringent standards or conduct research at the cutting edge of analytical feasibility. One of our R&D Scientists, Hamish Lamotte, presents an online demonstration on determining SIFT-MS LODs.
The demonstration includes: 1. Introduction – what is an LOD? 2. Practical examples of determining the LOD for ethylene oxide: -a. Using a series of SIFT-MS scans -b. Using a single SIFT-MS scan 3. Q&A
Syft Technologies provides its customers with tools which enable straightforward, pain-free LOD determination, as Hamish demonstrates.