Food and pharmaceutical products are susceptible to contamination from packaging – whether from polymeric materials, printing inks or paperboard. Traditional analytical techniques applied to trace volatile compound analysis typically involve significant sample preparation leading to low throughput, which is decreased further if chromatographic methods are also involved. The resulting high cost of analysis means that only limited sample screening is conducted.
This webinar describes a recent addition to the portfolio of techniques available for routine sample analysis: SIFT-MS. SIFT-MS is a direct mass spectrometry (DMS) technique that enables rapid, quantitative analysis of VOCs across the full spectrum of packaging materials. The SIFT-MS technique will be introduced, together with its automation, and detailed case studies will describe applications in polymeric and paperboard emissions analysis.