Highly controlled gas-phase reactions of ultra-low energy reagent ions with trace volatile analytes enable Syft Technologies’ SIFT-MS instruments to analyze air and headspace samples in real time, whilst disregarding bulk constituent gases such as nitrogen, oxygen and argon.
In this Syft Tech Talk, Dr Vaughan Langford (Principal Scientist at Syft Technologies) introduces the ion-molecule chemistry utilized in SIFT-MS instrumentation. This highly controlled, ultra-soft chemical ionization approach enables SIFT-MS instruments to comprehensively analyze samples with high specificity in real-time.
Whether you are a user of SIFT-MS instruments, or simply curious about SIFT-MS ion chemistry, then you will find this educational Tech Talk very helpful!