Syft App Talks #16. New Developments in Automated Sample Handling and Preparation Combined with SIFT-MS Analysis

New Developments in Automated Sample Handling and Preparation Combined with SIFT-MS Analysis
Kurt Thaxton, GERSTEL, USA & Germany

Sometimes it’s not possible to bring the SIFT-MS to the sample. This can happen for practical reasons (geographically remote sampling locations) or reasons related to the sample itself (transporting potentially contagious patients to a SIFT-MS for breath analysis). In these cases, the sample must be brought to the SIFT-MS, but how? Kurt discusses several ways that GERSTEL has worked with Syft to solve this problem, and fully automated the process along the way for easy and rapid answers.

Kurt Thaxton started as a research associate at International Paper, where he worked with the analysis of paper and building products, including thermal extraction and pyrolysis. Kurt later moved on and became involved in developing new instrumentation, as a mass spectrometry specialist, business director, and now as International Product Manager for Pyrolysis and Thermal Desorption at GERSTEL. His focus is in instrument design and development of standard methods at SAE, ASTM and ISO.