Knowledge Base

Learn more about the power of trace gas analysis using SIFT-MS. Download our latest brochures, application notes and white papers or watch an application-focused video. Questions? Contact us!

In this engaging presentation, Dr Mitch Rubenstein and Anthony Qualley first describe the context of their ground-breaking passive dosimetry research and the need for a new analytical approach.

Although TD was originally developed for use with gas chromatography mass spectrometry (GC/MS), there are some powerful benefits in integrating it with SIFT-MS – not least the higher sample throughputs and detection of chemically diverse compounds in a single analysis.

Direct mass spectrometry (direct MS) facilitates faster method development and validation, plus it provides high throughput for routine analysis.

SIFT-MS ion-molecule reactions usually follow predictable trends for a given functional group.

At the most fundamental level, what really differentiates SIFT-MS from other direct mass spectrometry techniques?

As a manufacturer of a relatively new analytical technology, Syft frequently gets asked whether SIFT-MS can analyze ‘such and such’… In this presentation, Dr Vaughan Langford describes the principles by which such questions can be answered and gives an outline of how we begin to develop the application itself.

Method Development for Automated Headspace Analysis Dr. Mark Perkins, Senior Applications Chemist, Anatune Limited, UK Automated SIFT-MS enables high-throughput analytical methods to be developed quickly and easily for a wide range of analytes, measured simultaneously, using static headspace analysis.

Use and Advantages of SIFT-MS in Proficiency Testing and Method Development at a Dynamic Test Gas Facility Christiane Kaus, IFA (The Institute for Occupational Safety and Health of German Social Accident Insurance), Germany Quantification of harmful substances in workplace environments is a topic of huge interest.

Method Validation for Automated Headspace Analysis Dr. Mark Perkins, Senior Applications Chemist, Anatune Limited, UK Automated SIFT-MS enables high-throughput analytical methods to be developed quickly and easily for a wide range of analytes, measured simultaneously, using static headspace analysis.

Source Apportionment and Quantification of Liquid and Headspace Leaks from Closed System Transfer Devices via SIFT-MS Drs Amos Doepke and Robert Streicher, CDC/NIOSH/HELD/CBMB, Cincinnati, USA A system to differentiate and quantify liquid and headspace leaks from closed system transfer devices (CSTDs) is presented.

New Developments in Automated Sample Handling and Preparation Combined with SIFT-MS Analysis Kurt Thaxton, GERSTEL, USA & Germany Sometimes it’s not possible to bring the SIFT-MS to the sample.

Calibration Approaches for Automated SIFT-MS Dr. Mark Perkins, Senior Applications Chemist, Anatune Limited, UK This presentation describe how instrument calibration is achieved very simply and rapidly with automated SIFT-MS instrumentation.