Knowledge Base

Learn more about the power of trace gas analysis using SIFT-MS. Download our latest brochures, application notes and white papers or watch an application-focused video. Questions? Contact us!

Webinar

Syft Technologies Tech Talks #9. Calibration Approaches for Automated SIFT-MS

This presentation describe how instrument calibration is achieved very simply and rapidly with automated SIFT-MS instrumentation.  Calibration is essential for contract testing laboratories and other regulatory measurements. Practical examples will be given to illustrate various approaches using SIFT-MS.

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Webinar

Syft App Talks #17. Time-Resolved Thermal Extraction of Volatiles from Plastic Materials using TD-SIFT-MS

In this presentation, examples of real-time thermal extraction and analysis of various plastic materials using TD-SIFT-MS are demonstrated, and its application to product development and processing environments are discussed. Direct, continuous analysis of formaldehyde from polyoxymethylene (POM) is of particular significance.

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Webinar

Syft Technologies Tech Talks #10. Calibration Approaches for Real-Time Analysis

In this Syft Tech Talk, Dr. Barry Prince – a highly experienced Principal Scientist at Syft Technologies – explains when calibration may be required and gives an overview of how it can be achieved for continuous, real-time analysis.

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Webinar

Online Demonstration: SIFT-MS in Breath Analysis

See a live demonstration of breath analysis using SIFT-MS!  Watch the breath head inlet in action and how it is used to characterize VOCs that are emitted following exercise.  

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Webinar

Online Demonstration: Introduction to SIFT-MS

This demonstration includes:

  • An overview of SIFT-MS and the companies that are benefiting from it
  • What distinguishes SIFT-MS from other mass spectrometry techniques
  • Examples of real-life applications of SIFT-MS
  • Live demonstrations: using SIFT-MS to analyze various samples
  • Breakdown of sample analysis, including Syft Technologies' custom software that displays data in real-time
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Webinar

Online Demonstration: SIFT-MS Compound ID

In this online workshop, Applications Scientist Thomas McKellar will demonstrate the data analysis and post-processing capabilities of Syft Technologies’ LabSyft software package. The Compound Identifier tool will be used to identify a compound in a simple mass spectrum.

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Webinar

Online Demonstration: LabSyft Pro - Application Software for SIFT-MS

Dr. Vaughan Langford, Principal Scientist at Syft Technologies, provides an online demonstration of the LabSyft Pro software package.

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Webinar

Online Demonstration: High Sensitivity with SIFT-MS

Hamish Lamotte, presents an online demonstration on determining SIFT-MS LODs. The demonstration includes an introduction to LODs, practical examples of determining the LOD for ethylene oxide, and a Q&A session.

 

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Webinar

Online Demonstration: LabSyft Library Database

This demonstration includes: - A general overview demonstrating the ease of access that the LabSyft Library provides - An outline of how the library enables SIFT-MS to capitalize on quantitation without calibration - An outline of how compound identification is facilitated by searching for product ions in the LabSyft Library - A concluding question and answer session.

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Webinar

Online Demonstration: LabSyft DataViewer

Join Dr Will Kerr, Technical Specialist at Syft Technologies, for this demonstration of the DataViewer’s capabilities.  It includes: - Navigating the DataViewer’s key features - Quickly and easily reviewing SIM and full scan SIFT-MS data - Extracting data and generating reports.

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Webinar

Online Demonstration: LabSyft Live Viewer

In this online demonstration you will see: - A general overview of the LabSyft Live Viewer tool - The different options for viewing Selected Ion Mode (SIM) and Full Scan data - How to change display settings to your preference - A question and answer session.

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Webinar

Online Demonstration - Method Editor

This online demonstration provides a basic overview of method editing using LabSyft, Syft's software suite. It shows how to easily create instrument methods to achieve rapid and quantitative results.

Two categories of instrument method are discussed:

  • Selected Ion Mode (SIM) methods for targeted analysis
  • Full Scan methods for untargeted/exploratory analysis
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