Instant Detection of Non-Conforming Raw Materials Using SIFT-MS: A Semiconductor Industry

SIFT-MS can continuously analyze volatiles that indicate non-conformance of raw materials, such as bulk gases utilized in semiconductor manufacture. By coupling SIFT-MS with multivariate statistical analysis, continuous quality assurance measurements can be realized.

In this webinar, Syft Technologies’ Principal Scientist Dr Vaughan Langford will describe how SIFT-MS can be deployed in both targeted and untargeted operational modes to enhance quality assurance and increase yields, via continuous monitoring.