Rapid Residual Solvent Analysis
A wide variety of solvents are used during the manufacture of pharmaceuticals, but regulations strictly control permissible concentrations in finished products. SIFT-MS provides a very rapid and highly sensitive solution for the detection of VOC residues in pharmaceuticals. SIFT-MS provides rapid characterization of compounds that are not easily monitored by other technologies.
Benefits of SIFT-MS:
- Direct analysis through elimination of chromatographic separation, which is ideal for detection of residual solvents
- High selectivity via multiple rapidly switchable reagent ions
- SIFT-MS provides a very rapid and highly sensitive solution for the detection of VOC residues in pharmaceuticals and rapid characterization of compounds that are not easily monitored by other technologies.
Rapid analysis for residual solvents using SIFT-MS.
Residual Solvent Analysis benefits
Comprehensive analysis, including inorganics and chromatographically challenging compounds
Flexible sample delivery options, including automation and area sampling
Intuitive software and fast method development
High sensitivity and wide linearity range
Automated high-throughput headspace analysis
Residual Solvent Analysis resources
Rapid Volatile Impurity Analysis in Pharmaceutical Products Using SIFT-MS
Rapid, Simplified Residual Solvent and Volatile Impurity Analysis Using SIFT-MS
Drying Endpoint Monitoring Using SIFT-MS For Enhanced Manufacturing Of Active Pharmaceutical Ingredients
Process analysis using SIFT-MS enables the drying process to be monitored past the drying end-point measurable using conventional weighing methods. This delivers greater efficiencies for production, and lowers risk of thermally damaging sensitive APIs.
Simple, Rapid Analysis Of Ethylene Oxide In A Polysorbate 80 Excipient Using SIFT-MS
Quantitative ethylene oxide analysis in Polysorbate 80 excipient is greatly simplified using SIFT-MS, with a time to first test result that is eight-fold faster than the current compendial method and a
daily sample throughput that is 9- to 14-fold higher.
Simple, Rapid Analysis Of Formaldehyde Impurities In Gelucire Excipient Using SIFT-MS
SIFT-MS greatly simplifies formaldehyde detection and quantitation through direct, instantaneous, and sensitive (sub-ppbV) sample ionization, yielding sample throughputs of up to 250+ samples/day.
Simple Rapid Analysis of NDMA in a Recalled Valsartan Product Using SIFT-MS
Quantitative analysis of NDMA impurities in drug products is greatly simplified using SIFT-MS and has a three-fold throughput advantage (excluding sample prep benefits) over chromatographic methods.