Petrochemical
Real-time VOC analysis for petrochemical applications that speeds up time to data in oil & gas surveying and production. Increase your capacity and shorten lead times in hydrocarbon characterization, BTEX fenceline monitoring, sour gas detection, and mudlogging.
SIFT-MS delivers high-throughput solutions that eliminate bottlenecks of the energy industry including prospecting, extraction, processing, environmental monitoring and product purity testing.
Most fuels and many modern products contain components that originate from hydrocarbons and other organic compounds occurring in crude oil. New commercial fuels, such as hydrogen, must meet stringent purity standards to prevent catalyst poisoning and premature degradation. SIFT-MS is the first technology that can quantify the full breadth of light-to-medium hydrocarbons and other VOCs in real-time, at the required concentrations, and with wide linear and dynamic ranges. SIFT-MS instruments also present a breakthrough in the detection, quantitation and tracing of petroleum hydrocarbons.
How we operate in the Petrochemical industry
Industry issue
High-penetration-rate drilling technologies present a challenge to current mud-gas analysis techniques: they are either too slow (gas chromatography (GC)), or do not quantify a complete range of compounds (photometric and electrochemical techniques).
Competitive benefit
Selected ion flow tube mass spectrometry (SIFT-MS) overcomes these limitations, identifying and quantifying volatile organic compounds (VOCs) directly from mud-tank headspace gas in real-time to the mid-part-per billion (ppb) concentration range. Hence SIFT-MS makes real-time hydrocarbon analysis viable in high penetration rate drilling operations.
Industry impact
The ability to quantify the volatile organics present in drilling mud, including the heavier hydrocarbon fractions, provides easy identification of hydrocarbon recirculation. Moreover, SIFT-MS minimizes both sample pre-treatment and calibration requirements, providing the ultimate solution for rapid, broad-spectrum hydrocarbon analysis at the well-side.Sample Customers
Petrochemical resources
Enhanced Environmental Monitoring 1: Fenceline and Odor Applications
Rapid Analysis of BTEX Using Thermal Desorption-SIFT-MS
Selected ion flow tube mass spectrometry (SIFT-MS) combined with GERSTEL automation greatly simplifies analysis of benzene, toluene, ethylbenzene and the xylenes (BTEX) sampled from ambient air using thermal desorption tubes. This application note demonstrates the repeatability and sensitivity achievable with automated thermal desorption (TD)-SIFT-MS. Automated TD-SIFT-MS provides sample throughputs at least three-fold higher than conventional TD-gas chromatography methods.
Rapid Analysis of BTEX in Water using Automated SIFT-MS
Selected ion flow tube mass spectrometry (SIFT-MS) combined with GERSTEL automation greatly simplifies analysis of benzene, toluene, ethylbenzene and the xylenes (BTEX) in water. This application note demonstrates the linearity, repeatability and sensitivity achievable with automated SIFT-MS. Automated static headspace (SH)-SIFT-MS provides sample throughputs at least three-fold higher than traditional purge-and-trap-gas chromatography methods.
Automotive Material and Tailpipe Emissions Analysis with SIFT-MS
Process and Specialty Gas Analysis Applications of Direct MS
Syft App Talks #14. Online Monitoring of CO Oxidation in PEM Fuel Cell - Isotopic Measurement and SIFT-MS Negative Reagent Ions
Syft Application Talks 3: Using SIFT-MS to Quickly and Accurately Look for Impurities in Hydrogen Fuel
Petrochemical Industry Gas Analysis Webinar
Real-Time Ethylene Oxide and Fence Line Monitoring Using SIFT-MS
Syft Tracer: The Next Generation of Volatile Impurities Analysis for Enhanced Workflows
This app note introduces the next generation of SIFT-MS, Syft TracerTM, which launched at Pittcon 2023. It revolutionizes volatile impurities analysis workflows through unparalleled speed, performance stability, and reproducibility. Learn about how this innovation to real-time trace gas detection outpaces chromatography-based methods in the analysis of challenging analytes such as formaldehyde in a PEG excipient.
The Latest Innovation of Real-Time, High-Throughput Volatile Impurities Analysis by SIFT-MS
Join us for this webinar to learn about Syft Tracer, the latest advancement of real-time, trace gas analysis by SIFT-MS which launched at Pittcon 2023. Hear how the recent product innovations unlock analytical bottlenecks and enable faster decisions to be made in critical process steps.
Syft Tracer Brochure
Syft TracerTM is the latest advancement in real-time, direct injection mass spectrometry (MS) built to solve the most difficult analytical challenges faced within a variety of industries and applications. This advancement to SIFT-MS delivers trace-level detection sensitivity, unparalleled performance stability, superior selectivity, and highly reproducible, quantitative data. Syft Tracer is optimized for high-throughput environments where continuous operation is the standard. Never miss a product or environmental contamination event again.
Revolutionary Productivity For Volatile Residue and Impurity Analysis
This application note describes a scenario in which Syft TracerTM replaces five chromatography systems and still has significant available sample capacity. SIFT-MS provides rapid, chromatography-free analysis that revolutionizes multiple workflows.
High-Throughput Analysis of Volatile Compounds in Air, Water, and Soil Using SIFT-MS
This study demonstrates high-throughput analysis of BTEX compounds from several matrices (air, water and soil). Detection limits in the single-digit part-per-billion concentration range (by volume) are readily achievable within seconds using SIFT-MS, because sample analysis is achieved without chromatography, pre-concentration, or drying. We also present a calibration approach that enables speciation of ethylbenzene from the xylenes in real time.
Headspace-SIFT-MS: Flexibility that Revolutionizes Workflows for Diverse Samples
The characteristic flexibility, stability, high throughput, and fast time to data of the Syft Tracer next-gen SIFT-MS instrument apply across multiple headspace approaches for diverse matrices. This application note briefly summarizes the use of (1) dissolution, (2) multiple headspace extraction (MHE), and (3) the method of standard additions, then provides a guide for identifying the appropriate headspace approach for various matrices.